Title：Digital calibration method and system for calibrating nonlinearity of analog-to-digital converter
Country：China
Patent No.：202110776524.X
Legal Status：Under review
Inventor：Xinpeng Xing, Lei Qian, Xueqian Shang, Zideng Xie
Assignee：International Graduate School at Shenzhen, Tsinghua University
Address：Tsinghua Campus, Xili University Town, Nanshan District, Shenzhen City 518059, Guangdong Province
Filing Date：2021-07-09
Issue Date：
Abstract：
The invention provides a digital calibration method and system for calibrating nonlinearity of an analog-to-digital converter, the digital calibration system comprises the analog-to-digital converter and an encoder, the analog-to-digital converter comprises a voltage-controlled oscillator and a frequency-to-digital module, the voltage-controlled oscillator comprises a tail current source, and the tail current source comprises a plurality of calibration MOS tubes. The digital calibration method comprises the following steps: S1, setting an initial value of a control code, and inputting an input voltage into an analog-to-digital converter; S2, enabling the analog-to-digital converter to determine an output Dout according to the input voltage; S3, determining whether the output Dout is equal to a linear critical value or not, if so, executing the step S5, and otherwise, executing the step S4; S4, encoding the output Dout into the control code through an encoder, controlling the state of the calibration MOS tube according to the control code, and updating the value of the output Dout; and S5, outputting the data of the output Dout. According to the method, the nonlinearity of the analog-to-digital converter can be effectively calibrated by using a simple structure.
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