Title：Method for calibrating time sequence deviation between TI-ADC channels
Country：China
Patent No.：202010707597.9
Legal Status：Authorized
Inventor：Fule Li, Meng Ni, Yang Ding
Assignee：Tsinghua University
Address：Tsinghua University,Haidian District Beijing 100084, China
Filing Date：2020-07-21
Issue Date：2022-11-11
Abstract：
The invention belongs to the technical field of TI-ADC time sequence deviation calibration, and particularly provides a method for calibrating time sequence deviation between TI-ADC channels. A TI-RADC which has the same clock frequency as a TI-ADC but has a co-prime interleaving factor is introduced as a conventional reference ADC, wherein the number of the conventional reference ADCs in an analog circuit is expanded from 1 to multiple, and an MUX with multiple inputs and one output is added, so the outputs of the conventional reference ADCs are used for time sequence deviation calibration. According to the invention, the problem of input impedance change in a calibration technology of using an additional reference ADC to perform time sequence deviation calibration is solved with extremely low circuit cost and power consumption cost, the implementation is simple, and the application value is high.
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