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Title:Calibration circuit and calibration methods of resistance temperature sensor chip

Country:China

Patent No.:201510213973.8

Legal Status:Authorized

Inventor:Xian Tang, Fule Li, Chun Zhang, Zhihua Wang

Assignee:Graduate School at Shenzhen, Tsinghua University

Address:Tsinghua Campus, Xili University Town, Nanshan District, Shenzhen City 518055, Guangdong Province

Filing Date:2015-04-29

Issue Date:2017-11-28

Abstract:

The invention discloses a calibrating circuit and a calibrating method for a resistance-type temperature sensing chip. The resistance-type temperature sensing chip comprises a chip circuit, and output of the resistance-type temperature sensing chip at any temperature is enabled to be in a linear relationship with a resistance value of a sensing resistor of the resistance type temperature sensing chip. The calibrating circuit comprises a comparing unit, a control signal generating unit and an adjusting unit, wherein the comparing unit is used for receiving the output of the resistance type temperature sensing chip at the temperature T and a target reference value, comparing the output with the target reference value and outputting a comparison result; the control signal generating unit is used for generating a control signal according to the comparison result output by the comparing unit; the adjusting unit is used for adjusting the output of the resistance type temperature sensing chip according to the control signal. The calibrating circuit and the calibrating method have the advantages that actual calibration of an internal circuit of the chip is achieved, the output of the chip is calibrated to be within a certain range, and design requirements of subsequent processing of the chip are lowered.

Patent Certificate: PDF/Jpg