Title：Correction apparatus and method for capacitor array SAR ADC

Country：China

Patent No.：201110124627.4

Legal Status：Authorized

Inventor：Libing Zhou, Liyuan Liu, Dongmei Li

Assignee：Tsinghua University

Address：Institute of Microelectronics,Tsinghua Univ. Beijing,10084

Filing Date：2011-05-13

Issue Date：2013-07-24

The invention relates to the capacitor array type successive approximation ADC calibration device and calibration method, a mixed-signal IC design field; The method comprises a capacitance measurement circuit, a static memory and the corresponding control circuit; also includes a connection in the capacitance measurement between the memory circuit and static logic unit; the method comprising: using a capacitance measuring circuit to be calibrated measured capacitance of the capacitor array of the true value; capacitor array according to the actual structure of the logical operation unit based on the measured capacitance value of the real the capacitor true weight value, and the weight value mapped into n-bit binary weight of code, the right to re-code stored in static memory, as the final weight code table; will be calibrated ADC output code with final weight make consequential amendments to the code table to get the final calibrated output code. The present invention either hardware cost advantages exist or conversion rate.

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