题目/Title：CMOS wireless stress sensor IC with 256-cell sensing array for ultra-thin applications

作者/Author：
                        Hanjun Jiang,Zheyao Wang,Shujie Yang,Heng Liu,Zhihua Wang

期刊/Journal：Electronics Letters

年份/Issue Date：2016Sept.

卷（期）及页码/Volume（No.）&pages：Vol.52, No.20, pp. 1660-1661

摘要/Abstract：
A wireless stress sensor integrated circuit (IC) has been implemented in 0.18 μm CMOS technology. The IC is composed of a 256-cell stress sensing array, the current-based sensor readout circuit, a 12 bit successive approximation (SAR) ADC and a 432 MHz wireless transmitter. The stress sensor employs orthogonally placed current source pair to measure the normal and shear stresses. The chip is backlapped to 35 μm for ultra-thin applications such as human skin stress distribution measurement. The measured sensing nonlinearity is below 0.7%. Experiments show that the implemented IC can be used to detect the facial expression changes.