题目/Title：Research on Testing of 32-bit CPU Based SiP

作者/Author：谢春林,乌力吉,张向民
                        Chunlin Xie,Liji Wu,Xiangmin Zhang

会议/Conference：ASICON 2011

地点/Location：Xiamen, China

年份/Issue Date：2011.25-28 Oct.

页码/pages：pp. 747 - 750

摘要/Abstract：
With the increment of high density in integrated circuit, the usual one-single chip system has been replaced by SoC (System on Chip) and SiP (System in Package). In the SiP system, which is usually a multi-chips system, more than one chip are packaged together. A typical SiP includes a CPU and an erasable memory. The testing of SiP is one important aspect of SiP designing.