题目/Title：Optimal fault detection for analogue circuits under manufacturing tolerances

作者/Author：
                        Geogies Gielen,Zhihua Wang,Willy Sansen

期刊/Journal：Electronics Letters

年份/Issue Date：1996Jan.

卷（期）及页码/Volume（No.）&pages：Vol.32, No.1, pp. 33 - 34

摘要/Abstract：
An optimal method for analogue fault detection is presented. Instead of using arbitrary decision windows, the method fully considers the VLSI manufacturing tolerances and mismatches to minimise the probability of erroneous test decision. A-priori simulated probability information is combined with the actual measurement data to decide whether the circuit is fault-free or faulty. Experimental results show the effectiveness of the proposed technique