题目/Title：Analysis and a Reduction Method of Temporal Noise in the CMOS Image Sensor Readout Chain

作者/Author：
                        Jingwei Wei;Dongmei Li;Jingxuan Qiao;Lixin Zhao

会议/Conference：ICTA 2018

地点/Location：Beijing, China

年份/Issue Date：2018.21-23 Nov.

页码/pages：pp. 128 - 129

摘要/Abstract：
This paper analyzes temporal noise in the CMOS image sensor readout chain. The impact of column capacitors on input-referred noise is discussed as the column capacitors make a major contribution to the area of column circuits. Based on the analysis, a new low-noise design method for CMOS image sensors of cellphones is proposed. By implementing MOM capacitors in the pixel array, the area of column readout circuits is effectively reduced.