Publications
Papers：
[1]
Dongmei Li,Zhihua Wang,Liying Huangfu,Qiujing Gou,Youhua Lei,Guolin Li,
Total Dose Effects with High Dose Rate in NMOS Transistors,
Chinese Journal of Electron Devices,
Vol.30, No.3, pp. 748 - 751,
2007.
Papers before joining ICAS：