题目/Title：A review on RF ESD protection design

作者/Author：
                        Albert Zihui Wang,Haigang Feng,Rouying Zhan,Haolu Xie,Guang Chen,Qiong Wu,Xiaokang Guan,Zhihua Wang,Chun Zhang

期刊/Journal：IEEE Transactions on Electron Devices

年份/Issue Date：2005July

卷（期）及页码/Volume（No.）&pages：Vol.52, No.7, pp. 1304 - 1311

摘要/Abstract：
Radio frequency (RF) electrostatic discharge (ESD) protection design emerges as a new challenge to RF integrated circuits (IC) design, where the main problem is associated with the complex interactions between the ESD protection network and the core RFIC circuit being protected. This paper reviews recent development in RF ESD protection circuit design, including mis-triggering of RF ESD protection structures, ESD-induced parasitic effects on RFIC performance, RF ESD protection solutions, as well as characterization of RF ESD protection circuits.